USDA experts help improve wheat yield measurement methodology in Georgia (May 6 – 8)


On May 6-8, U.S. Department of Agriculture (USDA) Georgia staff, with international expert in wheat statistics David Luckenbach from St Louis, Missouri and Mr. Michael Steiner, senior statistician from National Agricultural Statistics Service (NASS) from Washington DC, visited Shida Kartli and Kakheti regions with Georgian Ministry of Agriculture (MOA) representatives to pilot methodology for the wheat objective yield measurement survey. The purpose of this methodology is to provide the counts and measurements used to forecast wheat yields and information that measures changes in wheat hectares intended for harvest.